{"ID":2895262,"CreatedAt":"2026-06-01T04:54:23.091178241Z","UpdatedAt":"2026-06-01T04:54:23.091178241Z","DeletedAt":null,"paper_url":"https://arxiv.org/abs/2507.09697","arxiv_id":"2507.09697","title":"Curvature-adaptive gigapixel microscopy at submicron resolution and centimeter scale","abstract":"Large-area microscopy with submicron resolution is limited by tradeoffs between field of view (FOV), resolution, and imaging speed. Samples are rarely flat across centimeter-scale FOV, which often requires existing solutions to use mechanical scanning to ensure focused capture at reduced throughput. Here, we present PANORAMA, a single-shot, re-imaging microscope that achieves seamless, gigapixel imaging over a 16.3$\\times$18.8 $\\text{mm}^2$ FOV at 0.84 um resolution without mechanical scanning. By using a telecentric photolithography lens, a large-aperture tube lens, and a flat micro-camera array with adaptive per-camera focus control, PANORAMA maintains submicron focus across flat, curved or uneven samples that span centimeters. This approach improves imaging throughput and adaptability, enabling gigapixel multi-modal microscopy of large flat and non-flat samples in one shot, thus broadening its applications in biomedical and materials imaging.","short_abstract":"Large-area microscopy with submicron resolution is limited by tradeoffs between field of view (FOV), resolution, and imaging speed. Samples are rarely flat across centimeter-scale FOV, which often requires existing solutions to use mechanical scanning to ensure focused capture at reduced throughput. Here, we present PA...","url_abs":"https://arxiv.org/abs/2507.09697","url_pdf":"https://arxiv.org/pdf/2507.09697v2","authors":"[\"Xi Yang\",\"Haitao Chen\",\"Lucas Kreiss\",\"Clare B. Cook\",\"Genevieve Kuczewski\",\"Mark Harfouche\",\"Martin O. Bohlen\",\"Roarke Horstmeyer\"]","published":"2025-07-13T16:16:11Z","proceeding":"physics.optics","tasks":"[\"physics.optics\",\"eess.IV\"]","methods":"[]","has_code":false}