{"ID":2885568,"CreatedAt":"2026-06-01T04:54:23.091178241Z","UpdatedAt":"2026-06-01T04:54:23.091178241Z","DeletedAt":null,"paper_url":"https://arxiv.org/abs/2508.04106","arxiv_id":"2508.04106","title":"OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite","abstract":"Static Random-Access Memory (SRAM) yield analysis is essential for semiconductor innovation, yet research progress faces a critical challenge: the large gap between simplified academic models and the complexities observed in practice. The lack of open, higher-fidelity benchmarks has hindered reproducibility and transferability, as promising academic techniques often fail to carry over to more realistic settings. We present OpenYield, an open-source ecosystem that aims to narrow this gap through three contributions: (i) An SRAM circuit generator that explicitly incorporates second-order effects (interconnect/line parasitics, inter-cell leakage coupling, and peripheral-circuit variations) that are commonly omitted in academic studies. (ii) A standardized evaluation platform with a simple interface and baseline yield-analysis implementations to enable fair comparisons and reproducible research on these higher-fidelity circuits. (iii) An optimization platform for transistor-level sizing under these models, supporting reproducible studies of robustness/efficiency trade-offs. OpenYield aims to foster more reproducible and transferable progress in SRAM-yield research. The framework is publicly available at https://github.com/ShenShan123/OpenYield","short_abstract":"Static Random-Access Memory (SRAM) yield analysis is essential for semiconductor innovation, yet research progress faces a critical challenge: the large gap between simplified academic models and the complexities observed in practice. The lack of open, higher-fidelity benchmarks has hindered reproducibility and transfe...","url_abs":"https://arxiv.org/abs/2508.04106","url_pdf":"https://arxiv.org/pdf/2508.04106v2","authors":"[\"Shan Shen\",\"Xingyang Li\",\"Zhuohua Liu\",\"Junhao Ma\",\"Yikai Wang\",\"Yiheng Wu\",\"Yuquan Sun\",\"Wei W. Xing\"]","published":"2025-08-06T06:04:02Z","proceeding":"cs.AR","tasks":"[\"cs.AR\"]","methods":"[]","has_code":false,"code_links":[{"ID":611212,"CreatedAt":"2026-06-01T04:54:23.091178241Z","UpdatedAt":"2026-06-01T04:54:23.091178241Z","DeletedAt":null,"paper_id":2885568,"paper_url":"https://arxiv.org/abs/2508.04106","paper_title":"OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite","repo_url":"https://github.com/ShenShan123/OpenYield","is_official":false,"mentioned_in_paper":false,"mentioned_in_github":true,"github_stars":0}]}