{"ID":2862299,"CreatedAt":"2026-06-01T04:54:23.091178241Z","UpdatedAt":"2026-06-01T04:54:23.091178241Z","DeletedAt":null,"paper_url":"https://arxiv.org/abs/2510.01393","arxiv_id":"2510.01393","title":"E-FuzzEdge: Optimizing Embedded Device Security with Scalable In-Place Fuzzing","abstract":"In this paper we show E-FuzzEdge, a novel fuzzing architecture targeted towards improving the throughput of fuzzing campaigns in contexts where scalability is unavailable. E-FuzzEdge addresses the inefficiencies of hardware-in-the-loop fuzzing for microcontrollers by optimizing execution speed. We evaluated our system against state-of-the-art benchmarks, demonstrating significant performance improvements. A key advantage of E-FuzzEdgearchitecture is its compatibility with other embedded fuzzing techniques that perform on device testing instead of firmware emulation. This means that the broader embedded fuzzing community can integrate E-FuzzEdge into their workflows to enhance overall testing efficiency.","short_abstract":"In this paper we show E-FuzzEdge, a novel fuzzing architecture targeted towards improving the throughput of fuzzing campaigns in contexts where scalability is unavailable. E-FuzzEdge addresses the inefficiencies of hardware-in-the-loop fuzzing for microcontrollers by optimizing execution speed. We evaluated our system...","url_abs":"https://arxiv.org/abs/2510.01393","url_pdf":"https://arxiv.org/pdf/2510.01393v1","authors":"[\"Davide Rusconi\",\"Osama Yousef\",\"Mirco Picca\",\"Flavio Toffalini\",\"Andrea Lanzi\"]","published":"2025-10-01T19:24:35Z","proceeding":"cs.CR","tasks":"[\"cs.CR\"]","methods":"[]","has_code":false}