{"ID":2855024,"CreatedAt":"2026-06-01T04:54:23.091178241Z","UpdatedAt":"2026-06-01T04:54:23.091178241Z","DeletedAt":null,"paper_url":"https://arxiv.org/abs/2510.13226","arxiv_id":"2510.13226","title":"Sample-Centric Multi-Task Learning for Detection and Segmentation of Industrial Surface Defects","abstract":"Industrial surface defect inspection for sample-wise quality control (QC) must simultaneously decide whether a given sample contains defects and localize those defects spatially. In real production lines, extreme foreground-background imbalance, defect sparsity with a long-tailed scale distribution, and low contrast are common. As a result, pixel-centric training and evaluation are easily dominated by large homogeneous regions, making it difficult to drive models to attend to small or low-contrast defects-one of the main bottlenecks for deployment. Empirically, existing models achieve strong pixel-overlap metrics (e.g., mIoU) but exhibit insufficient stability at the sample level, especially for sparse or slender defects. The root cause is a mismatch between the optimization objective and the granularity of QC decisions. To address this, we propose a sample-centric multi-task learning framework and evaluation suite. Built on a shared-encoder architecture, the method jointly learns sample-level defect classification and pixel-level mask localization. Sample-level supervision modulates the feature distribution and, at the gradient level, continually boosts recall for small and low-contrast defects, while the segmentation branch preserves boundary and shape details to enhance per-sample decision stability and reduce misses. For evaluation, we propose decision-linked metrics, Seg_mIoU and Seg_Recall, which remove the bias of classical mIoU caused by empty or true-negative samples and tightly couple localization quality with sample-level decisions. Experiments on two benchmark datasets demonstrate that our approach substantially improves the reliability of sample-level decisions and the completeness of defect localization.","short_abstract":"Industrial surface defect inspection for sample-wise quality control (QC) must simultaneously decide whether a given sample contains defects and localize those defects spatially. In real production lines, extreme foreground-background imbalance, defect sparsity with a long-tailed scale distribution, and low contrast ar...","url_abs":"https://arxiv.org/abs/2510.13226","url_pdf":"https://arxiv.org/pdf/2510.13226v1","authors":"[\"Hang-Cheng Dong\",\"Yibo Jiao\",\"Fupeng Wei\",\"Guodong Liu\",\"Dong Ye\",\"Bingguo Liu\"]","published":"2025-10-15T07:24:26Z","proceeding":"cs.CV","tasks":"[\"cs.CV\",\"cs.LG\"]","methods":"[]","has_code":false}